N. N. Iosad

Identifiers

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Papers (2)

1. Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors cond-mat.other · 2004 · author #2
2. Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors cond-mat.mtrl-sci · 2004 · author #3

Mentions

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Frequent Coauthors

• A. F. Morpurgo 2 shared papers
• A. F. Stassen 2 shared papers
• R. W. I. de Boer 2 shared papers
• T. M. Klapwijk 1 shared papers