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John Test

Identifiers

  • name variant John Test 0.60 · backfill

Papers (2)

  1. The Black Hole Explorer: Back End Electronics astro-ph.IM · 2024 · author #6
  2. A Multi-Baseline 12 GHz Atmospheric Phase Interferometer with One Micron Path Length Sensitivity astro-ph.IM · 2012 · author #7

Mentions

  • 2406.10103 #6 · arxiv_oai · confidence 0.70 John Test
  • 1206.0039 #7 · arxiv_oai · confidence 0.70 John Test
  • 1206.0039 #7 · backfill · confidence 0.70 John Test

Frequent Coauthors