Kenji Fukuda

Identifiers

• name variant Kenji Fukuda 0.60 · backfill

Papers (1)

1. Characterization of Interface Traps in SiO$_2$/SiC Structures Close to the Conduction Band by Deep-Level Transient Spectroscopy cond-mat.mtrl-sci · 2014 · author #4

Mentions

• 1409.7170 #4 · backfill · confidence 0.70 Kenji Fukuda

Frequent Coauthors

• Hajime Okumura 1 shared papers
• Mitsuru Sometani 1 shared papers
• Tetsuo Hatakeyama 1 shared papers
• Tsunenobu Kimoto 1 shared papers
• Yoshiyuki Yonezawa 1 shared papers