A. Salehpour

Identifiers

• name variant A. Salehpour 0.50 · backfill

Papers (1)

1. Measurement of thickness of thin film by fitting to the intensity profile of Fresnel diffraction from a nano phase step physics.ins-det · 2018 · author #3

Mentions

No mention provenance yet.

Frequent Coauthors

• Ali Motazedifard 1 shared papers
• S. Dehbod 1 shared papers