Thomas Poehlsen
Identifiers
- name variant Thomas Poehlsen 0.60 · backfill
Papers (5)
- Time dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensors physics.ins-det · 2013 · author #1
- Study of the accumulation layer and charge losses at the Si-SiO2 interface in p+n-silicon strip sensors physics.ins-det · 2013 · author #1
- Challenges for Silicon Pixel Sensors at the European XFEL physics.ins-det · 2012 · author #5
- Charge losses in segmented silicon sensors at the Si-SiO2 interface physics.ins-det · 2012 · author #1
- Study of X-ray Radiation Damage in Silicon Sensors physics.ins-det · 2011 · author #6
Mentions
Frequent Coauthors
- Eckhart Fretwurst 5 shared papers
- Jiaguo Zhang 5 shared papers
- Robert Klanner 5 shared papers
- J\"orn Schwandt 3 shared papers
- Ioana Pintilie 2 shared papers
- Joern Schwandt 2 shared papers
- Julian Becker 2 shared papers
- Hanno Perrey 1 shared papers
- Sergej Schuwalow 1 shared papers