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Roberto C. Longo

Identifiers

  • name variant Roberto C. Longo 0.60 · backfill

Papers (1)

  1. Electronic Properties of MoS2/HfO2 Interface: Impact of Interfacial Impurities during Atomic Layer Deposition Growth cond-mat.mtrl-sci · 2014 · author #2

Mentions

  • 1402.0457 #2 · backfill · confidence 0.70 Roberto C. Longo

Frequent Coauthors