SR-XRT under six-beam conditions reveals kinematical-to-dynamical transition and determines a-type Burgers vectors of TEDs in thick ammonothermal GaN via g·b invisibility and image-width matching.
Authier, Dynamical theory of X-ray diffraction, revised edition, Oxford University Press Inc., New York, (2001) p.139–p.147
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Kinematical and dynamical contrast of dislocations in thick GaN substrates observed by synchrotron-radiation X-ray topography under six-beam diffraction conditions
SR-XRT under six-beam conditions reveals kinematical-to-dynamical transition and determines a-type Burgers vectors of TEDs in thick ammonothermal GaN via g·b invisibility and image-width matching.