SiPO decouples projection shape from dose scaling in TVAM by turning normalized conformity and spillage metrics into a solvable linear program with two practical control cases.
Tomographic color Schlieren refractive inde x mapping for computed axial lithography
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Scale-invariant projection optimization in tomographic volumetric additive manufacturing
SiPO decouples projection shape from dose scaling in TVAM by turning normalized conformity and spillage metrics into a solvable linear program with two practical control cases.