A review chapter summarizing STEM techniques and applications to oxide interfaces, including interfacial conductivity, charge screening, and emerging AI-guided methods.
L.et al.An electron microscope for the aberration-corrected era.Ultramicroscopy 108,179–95
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Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy
A review chapter summarizing STEM techniques and applications to oxide interfaces, including interfacial conductivity, charge screening, and emerging AI-guided methods.