Cross-correlated CSI adds a term interrelating state and data errors to the standard CSI cost functional, yielding higher accuracy and robustness than classical CSI and MR-CSI on 2D TM/TE benchmarks.
A simple method for solving inverse scattering problems in the resonance region
2 Pith papers cite this work. Polarity classification is still indexing.
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A linear MMV-based inverse scattering model with joint sparsity regularization is introduced for single-frequency imaging of highly conductive objects, showing higher resolution than linear sampling methods on synthetic and Fresnel data.
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Cross-correlated Contrast Source Inversion
Cross-correlated CSI adds a term interrelating state and data errors to the standard CSI cost functional, yielding higher accuracy and robustness than classical CSI and MR-CSI on 2D TM/TE benchmarks.
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A Linear Model for Microwave Imaging of Highly Conductive Scatterers
A linear MMV-based inverse scattering model with joint sparsity regularization is introduced for single-frequency imaging of highly conductive objects, showing higher resolution than linear sampling methods on synthetic and Fresnel data.