Precession-assisted 4D-STEM combined with Sobel filter and SVD post-processing enables accurate, artefact-reduced mapping of electric fields and charge distributions across random grain boundaries in BaTiO3 and SrTiO3.
Maier, Ionic conduction in space charge regions, Progress in solid state chemistry, 23 (1995) 171-263
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Accurate Nanoscale Mapping of Electric Fields across Random Grain Boundaries in Polycrystalline Oxides Using Precession-Assisted 4D-STEM
Precession-assisted 4D-STEM combined with Sobel filter and SVD post-processing enables accurate, artefact-reduced mapping of electric fields and charge distributions across random grain boundaries in BaTiO3 and SrTiO3.