Monolithically integrated InGaAs/GaAs quantum dot on silicon produces energy-time entangled photons under two-photon excitation, with two-photon interference visibilities up to 64% in short time windows.
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Statistical benchmark methods originally for discriminating boson sampling can quantify noises like partial distinguishability and loss, performing better with high-order correlators, while a new fast simulation scheme for noisy samples is introduced.
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Energy-time entanglement from a monolithically integrated quantum dot on silicon
Monolithically integrated InGaAs/GaAs quantum dot on silicon produces energy-time entangled photons under two-photon excitation, with two-photon interference visibilities up to 64% in short time windows.
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Evaluating noises of fast-simulated boson sampling with statistical benchmark methods
Statistical benchmark methods originally for discriminating boson sampling can quantify noises like partial distinguishability and loss, performing better with high-order correlators, while a new fast simulation scheme for noisy samples is introduced.