MSET and CEP deliver higher reliability than SECDED ECC for CNNs and Vision Transformers with zero memory overhead and substantially lower area and delay.
Soft error reliability analysis of vision transformers
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Effective and Memory-Efficient Alternatives to ECC for Reliable Large-Scale DNNs
MSET and CEP deliver higher reliability than SECDED ECC for CNNs and Vision Transformers with zero memory overhead and substantially lower area and delay.