Multi-frequency CC-CSI outperforms MR-CSI for reconstructing complicated scatterers from TM and TE electromagnetic data in both simulations and experiments.
Shin, 3D finite-difference frequency-domain method for plasmonics and nanophotonics
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Inversion of Multi-frequency Data with the Cross-Correlated Contrast Source Inversion Method
Multi-frequency CC-CSI outperforms MR-CSI for reconstructing complicated scatterers from TM and TE electromagnetic data in both simulations and experiments.