pBTI stress broadens IGZO band tail states causing negative VT shifts, revealed by DC and 1/f noise data with reversibility confirmed by recovery and hydrogen-doping simulations.
Low-frequency noise and DC I–V characterization of gamma-ray irradiation-induced degradation and trap behaviors in a-IGZO TFTs
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Band Tail State Broadening in IGZO TFTs After pBTI-Induced Negative VT Shift Revealed via DC and 1/f Noise Measurements
pBTI stress broadens IGZO band tail states causing negative VT shifts, revealed by DC and 1/f noise data with reversibility confirmed by recovery and hydrogen-doping simulations.