A 3D phase tomography method extracts the voltage-dependent exchange phase volume in silicon quantum dots using holography-style measurements and PUMA unwrapping to identify optimal pi-pulse locations.
Phase-shifting in-line digital holography on a digital micro-mirror device.Optics and Lasers in Engi- neering, 47(9):896–901
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3D tomography of exchange phase in a Si/SiGe quantum dot device
A 3D phase tomography method extracts the voltage-dependent exchange phase volume in silicon quantum dots using holography-style measurements and PUMA unwrapping to identify optimal pi-pulse locations.