Onset of melting in copper produces a transient conductivity increase by suppressing grain-boundary scattering, observed with single-shot THz spectroscopy and supported by two-temperature MD simulations.
Palasantzas, Surface roughness and grain boundary scattering effects on the electrical con- ductivity of thin films, Physical Review B58, 9685 (1998)
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Electronic Signature of Melting Onset in Polycrystalline Copper at Extreme Conditions
Onset of melting in copper produces a transient conductivity increase by suppressing grain-boundary scattering, observed with single-shot THz spectroscopy and supported by two-temperature MD simulations.