Experimental data indicate logarithmic annealing in pMNOS RADFET dosimeters consistent with a prior model.
Non - equilibrium Carrier Capture, Recombination and Anne aling in Thick Insulators and their I m- pact on Radiation Hardness
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Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters
Experimental data indicate logarithmic annealing in pMNOS RADFET dosimeters consistent with a prior model.