Unsupervised clustering applied to disk-detected nanobeam electron diffraction vectors automates decomposition of polycrystalline, single-crystal, and amorphous sample components.
Ophus, Four -Dimensional Scanning Transmission Electron Microscopy (4D -STEM): From Scanning Nanodiffraction to Ptychography and Beyond, Microsc Microanal 25 (2019) 563–582
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High Throughput Analysis of Nanobeam Electron Diffraction Datasets using Unsupervised Clustering
Unsupervised clustering applied to disk-detected nanobeam electron diffraction vectors automates decomposition of polycrystalline, single-crystal, and amorphous sample components.
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