CIMP achieves 84.4% top-1 cross-modal retrieval between HAADF-STEM images and metadata, recovers all seven acquisition parameters via linear probe, and yields a denoiser preferred by experts over SOTA on 70.2% of blind trials.
A longer dwell time leads to more electrons hitting the sample at each pixel position and consequently leads to a higher signal image
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Contrastive Image-Metadata Pre-Training for Materials Transmission Electron Microscopy
CIMP achieves 84.4% top-1 cross-modal retrieval between HAADF-STEM images and metadata, recovers all seven acquisition parameters via linear probe, and yields a denoiser preferred by experts over SOTA on 70.2% of blind trials.