A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.
Detrimental impact of technological processes on b ti reliability of advanced high -K/metal gate stacks,
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Building Reliable Arithmetic Multipliers Under NBTI Aging and Process Variations
A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.