ref [35] · 2509.07140 · notice #10504 · dispute
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Muller, Three-Dimensional Imaging in Aberration-Corrected Elec- tron Microscopes. Microscopy and Microanalysis 16 (4), 445-455 (2010), doi:10.1017/ S1431927610093360, https://doi.org/10.1017/S1431927610093360. 35. D. Van Dyck, J. R. Jinschek, F.-R. Chen, 'Big Bang' tomography as a new route to atomic-resolution electron tomography. Nature 486 (7402), 243-246 (2012), doi:10.1038/ nature11074, https://doi.org/10.1038/nature11074. 36. D. Rhodes, S. H. Chae, R. Ribeiro-Palau, J. Hone, Disorder in van der Waals het- erostructures of 2D materials. Nature Materials 18 (6), 541-549 (2019), doi:10.1038/ s41563-019-0366-8, https://doi.org/10.1038/s41563-019-0366-8 . 37. S. M. Hus, et al. , Observation of single-defect memristor in an MoS 2 atomic sheet. Nature Nanotechnology 16 (1), 58-62 (2021), doi:10.
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Muller, Three-Dimensional Imaging in Aberration-Corrected Elec- tron Microscopes. Microscopy and Microanalysis 16 (4), 445-455 (2010), doi:10.1017/ S1431927610093360, https://doi.org/10.1017/S1431927610093360. 35. D. Van Dyck, J. R. Jinschek, F.-R. Chen, 'Big Bang' tomography as a new route to atomic-resolution electron tomography. Nature 486 (7402), 243-246 (2012), doi:10.1038/ nature11074, https://doi.org/10.1038/nature11074. 36. D. Rhodes, S. H. Chae, R. Ribeiro-Palau, J. Hone, Disorder in van der Waals het- erostructures of 2D materials. Nature Materials 18 (6), 541-549 (2019), doi:10.1038/ s41563-019-0366-8, https://doi.org/10.1038/s41563-019-0366-8 . 37. S. M. Hus, et al., Observation of single-defect memristor in an MoS 2 atomic sheet. Nature Nanotechnology 16 (1), 58-62 (2021), doi:10