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High-Temperature and High-Speed Atomic Force Microscopy Using a qPlus Sensor in Liquid via Quadpod Scanner and Hybrid-Loop Frequency Demodulation
ref [9] · 2604.04970 · notice #7844 · dispute
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K. Kobayashi, H. Yamada, K. Matsushige, Frequency noise in frequency modulation atomic force microscopy, Review of Scientific Instruments 2009, 80, no. 4 043708, DOI: 10.1063/1.3120913 https://doi.org/10.1063/1.3120913