Citation notice #10564 · 2026-08-16 12:18:07.180027+00:00
Instability of oxide perovskite surfaces induced by vacancy formation
cites Zaccone, Explaining the thickness-dependent dielectric permittivity of thin films, Physical Review B109, 10.1103/physrevb.109.115435 (2024), which carries a correction notice dated 2024-03-28. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.
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01Evidence
Raw extraction · bibliography line · bibliography index 12
A. Zaccone, Explaining the thickness-dependent dielectric permittivity of thin films, Physical Review B109, 10.1103/physrevb.109.115435 (2024)
02Event
- Type
- Correction
- Source
- Crossref
- Original DOI
- 10.1103/physrevb.109.115435
- Notice DOI
- 10.1103/physrevb.109.115435
- Date
- 2024-03-28
- Title
- Explaining the thickness-dependent dielectric permittivity of thin films
- Reasons
- ['Correction']
- Work
- Zaccone, Explaining the thickness-dependent dielectric permittivity of thin films, Physical Review B109, 10.1103/physrevb.109.115435 (2024) (2024)
03Dispute this notice
If this citation does not depend on the flagged claim, or the event is wrong, say so. Disputes are public. For a signed challenge against the paper itself, use the formal challenge form.