Characterisation of a Thin Fully-Depleted SOI Pixel Sensor with Soft X-ray Radiation

Craig Tindall; Dario Bisello; Devis Contarato; Marco Battaglia; Peter Denes; Richard Celestre; Serena Mattiazzo

arxiv: 1111.2151 · v1 · pith:AJQL4MPInew · submitted 2011-11-09 · ⚛️ physics.ins-det

Characterisation of a Thin Fully-Depleted SOI Pixel Sensor with Soft X-ray Radiation

Marco Battaglia , Dario Bisello , Richard Celestre , Devis Contarato , Peter Denes , Serena Mattiazzo , Craig Tindall This is my paper

classification ⚛️ physics.ins-det

keywords sensorcharacterisationpixelradiationsoftthinx-raysadvanced

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This paper presents the results of the characterisation of a back-illuminated pixel sensor manufactured in Silicon-On-Insulator technology on a high-resistivity substrate with soft X-rays. The sensor is thinned and a thin Phosphor layer contact is implanted on the back-plane. The response to X-rays from 2.12 up to 8.6 keV is evaluated with fluorescence radiation at the LBNL Advanced Light Source.

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Characterisation of a Thin Fully-Depleted SOI Pixel Sensor with Soft X-ray Radiation

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