Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-06T17:24:49.026338Z
Paper Citation Record · LEDGER
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review
As of 17 August 2026, this Paper Citation Record lists 66 of 66 outbound references and 0 inbound Pith citation observations for arXiv:2507.10983.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-17T06:30:58.91139+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
66 of 66 outbound references displayed
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External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 326d39fb-7726-4fc1-90d4-12e4e6b1e12a · outbound
This paper cites N., 2012.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review N., 2012
Reference 1
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation df8d66cc-d8f4-4275-a6dc-3b0e743779fc · outbound
This paper cites N., 2012, page 88, Chapter 3.1.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review N., 2012, page 88, Chapter 3.1
Reference 2
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 84e2701a-e9bc-4d91-be34-9b18457c287c · outbound
This paper cites N., 2012, page 135, Chapter 3.3.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review N., 2012, page 135, Chapter 3.3
Reference 3
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 7ba33ccd-1c44-4108-99f5-7f8b81687eac · outbound
This paper cites Handbook of thin film deposition.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Handbook of thin film deposition
Reference 4
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 080aa49e-9f05-4b03-8574-342ddddeb378 · outbound
This paper cites F., Butler, S.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review F., Butler, S
Reference 5
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 6cabeb66-3bc8-4bde-bb73-98dba779d362 · outbound
This paper cites What is machine learning?.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review What is machine learning?
Reference 6
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 6acfda9b-b6b7-41a7-9b8f-be53fb544d19 · outbound
This paper cites D., 2019.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review D., 2019
Reference 7
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation d8da95ea-dfa1-44b5-9797-a009c9a23531 · outbound
This paper cites an unresolved cited work.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work
Reference 8
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 59bf0381-29ea-4b42-ad90-807fbdca7c7b · outbound
This paper cites Physics- informed machine learning.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics- informed machine learning
Reference 9
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 3bf8ee57-f969-4b7a-822d-58b32262e11b · outbound
This paper cites Physics-informed neural networks: A deep learning framework for solving forward and inverse problems in- volving nonlinear partial differential equations.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-informed neural networks: A deep learning framework for solving forward and inverse problems in- volving nonlinear partial differential equations
Reference 10
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation bd25bb3b-08ea-40f7-9803-f225697a1ffe · outbound
This paper cites Introduction to semiconductor manufactur- ing technology.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Introduction to semiconductor manufactur- ing technology
Reference 11
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation ea674ae3-4158-4ccb-aae8-7f55268c041b · outbound
This paper cites Moore’s law.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Moore’s law
Reference 12
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation d419c2ec-1bd2-4ea7-b990-03593878738b · outbound
This paper cites Euv lithography.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Euv lithography
Reference 13
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation df0b2830-5798-4459-a294-6304b16855e4 · outbound
This paper cites Introduction to fin- fet: Formation process, strengths, and future exploration.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Introduction to fin- fet: Formation process, strengths, and future exploration
Reference 14
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 1d538ad8-cd86-4a25-adb9-a1b2c7692141 · outbound
This paper cites Finfet ver- sus gate-all-around nanowire fet: Performance, scaling, and variability.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Finfet ver- sus gate-all-around nanowire fet: Performance, scaling, and variability
Reference 15
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 3051e1e4-ee15-4a9a-a8e1-903d87263355 · outbound
This paper cites High-k/metal gate innovations en- abling continued cmos scaling.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review High-k/metal gate innovations en- abling continued cmos scaling
Reference 16
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 45bbbeaa-4d12-47d6-94fd-a1d797316adc · outbound
This paper cites Recent advances and trends in advanced packaging.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Recent advances and trends in advanced packaging
Reference 17
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation a385feb9-0e8d-4b9b-9385-d807c14065a8 · outbound
This paper cites Chapter 12 - structure and prop- erties of films.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Chapter 12 - structure and prop- erties of films
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.664336Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation e7b77a75-eb4b-403a-8ef3-19a464a19c41 · outbound
This paper cites E., 2000.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review E., 2000
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.651939Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 5068aa08-2ace-4133-b427-344981100d76 · outbound
This paper cites Chemical methods of thin film de- position: Chemical vapor deposition, atomic layer depo- sition, and related technologies.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Chemical methods of thin film de- position: Chemical vapor deposition, atomic layer depo- sition, and related technologies
Reference 20
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.640198Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 54ccd40e-8782-4b28-82f9-c9c3c9c1665f · outbound
This paper cites Atomic layer deposi- tion and other thin film deposition techniques: from princi- ples to film properties.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Atomic layer deposi- tion and other thin film deposition techniques: from princi- ples to film properties
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.627897Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 9a9f80de-9ea0-4ed1-acba-d4f64c4fe5cc · outbound
This paper cites Chapter 3 - an overview of deep learning in big data, image, and signal processing in the modern digital age.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Chapter 3 - an overview of deep learning in big data, image, and signal processing in the modern digital age
Reference 22
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.614570Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 9df47f6b-eaf2-4a9c-ba96-758f77293c95 · outbound
This paper cites A comprehensive literature review of the applications of ai techniques through the lifecycle of indus- trial equipment.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A comprehensive literature review of the applications of ai techniques through the lifecycle of indus- trial equipment
Reference 23
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation f9210478-148d-49ac-8539-48f0a807b945 · outbound
This paper cites Artificial intelligence and machine learning approaches to energy demand-side response: A systematic review.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Artificial intelligence and machine learning approaches to energy demand-side response: A systematic review
Reference 24
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 56823f20-447f-444d-a173-ecb5d9a759c5 · outbound
This paper cites Deepsem- net: Enhancing sem defect analysis in semiconductor manufacturing with a dual-branch cnn-transformer archi- tecture.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Deepsem- net: Enhancing sem defect analysis in semiconductor manufacturing with a dual-branch cnn-transformer archi- tecture
Reference 25
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.580469Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation e200259c-ff7e-4fdb-b689-267e4ad91dfe · outbound
This paper cites Image-driven machine learning for automatic characterization of grain size and distribution in smart vanadium dioxide thin films.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Image-driven machine learning for automatic characterization of grain size and distribution in smart vanadium dioxide thin films
Reference 26
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation cd4f7316-7f1e-4410-937d-c852285e1149 · outbound
This paper cites Deep transfer wasserstein adversarial network for wafer map defect recognition.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Deep transfer wasserstein adversarial network for wafer map defect recognition
Reference 27
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation fe9c432b-da5d-42d7-a2e7-03be2a9c5388 · outbound
This paper cites an unresolved cited work.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work
Reference 28
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T17:24:49.548945Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 1df7dbc5-d63b-43e1-b30e-9ca888f09cca · outbound
This paper cites Humana Press, Totowa, NJ, pp.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Humana Press, Totowa, NJ, pp
Reference 29
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 4390176b-b4db-48bf-9f84-a916e101d4ad · outbound
This paper cites Machine learning-based model- ing and operation for ald of sio2 thin-films using data from a multiscale cfd simulation.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Machine learning-based model- ing and operation for ald of sio2 thin-films using data from a multiscale cfd simulation
Reference 30
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 8ebdc118-cb94-4255-8da9-55c99aac9cd3 · outbound
This paper cites an unresolved cited work.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work
Reference 31
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation a892a3cb-89a2-4c4b-9a62-39d5e2f1fef9 · outbound
This paper cites an unresolved cited work.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work
Reference 33
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 4683a322-a880-48b2-a2c2-5ab832761bf4 · outbound
This paper cites Deep reinforcement learning: A brief survey.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Deep reinforcement learning: A brief survey
Reference 34
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 3c991e2f-74be-459d-b5ea-88788994119c · outbound
This paper cites Exploring machine learning for semiconductor process optimization: A sys- tematic review.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Exploring machine learning for semiconductor process optimization: A sys- tematic review
Reference 35
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation f1589db9-0bb3-4078-9852-1dd935212ce5 · outbound
This paper cites Artifi- cial neural network discrimination for parameter estimation and optimal product design of thin films manufactured by chemical vapor deposition.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Artifi- cial neural network discrimination for parameter estimation and optimal product design of thin films manufactured by chemical vapor deposition
Reference 36
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 82a144d2-5b2e-4c92-8bd6-e00bb61ad8da · outbound
This paper cites an unresolved cited work.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work
Reference 37
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation e4d8ec54-60d0-4b09-adf0-f90da41016e8 · outbound
This paper cites Optimizing the chemical vapor deposition process of 4h–sic epitaxial layer growth with machine-learning-assisted multiphysics simulations.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Optimizing the chemical vapor deposition process of 4h–sic epitaxial layer growth with machine-learning-assisted multiphysics simulations
Reference 38
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation bf3b1368-56df-4948-a3aa-a5a1e66d9066 · outbound
This paper cites When magnetron sput- tering deposition meets machine learning: Application to process anomaly detection.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review When magnetron sput- tering deposition meets machine learning: Application to process anomaly detection
Reference 39
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.428434Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 726ddccb-c6df-4c75-b2ef-91b5a080fdc5 · outbound
This paper cites A contextual sensor system for non-intrusive machine status and energy monitoring.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A contextual sensor system for non-intrusive machine status and energy monitoring
Reference 40
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.417775Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 4e2f9df8-4547-4903-9f05-6d105a36e591 · outbound
This paper cites Accelerating power flow calcu- lations in lv networks using physics-informed graph neural networks.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Accelerating power flow calcu- lations in lv networks using physics-informed graph neural networks
Reference 41
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.405663Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 0d1a3d2d-7ab7-45cc-b966-b8470321693c · outbound
This paper cites Physical activation functions (pafs): An approach for more efficient induction of physics into physics-informed neural networks (pinns).
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physical activation functions (pafs): An approach for more efficient induction of physics into physics-informed neural networks (pinns)
Reference 42
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.395948Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation a798f3ac-c260-4cc7-9386-96ec12f64369 · outbound
This paper cites Physics-Informed Machine Learning: A Survey on Problems, Methods and Applications.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-Informed Machine Learning: A Survey on Problems, Methods and Applications
Reference 43
- Resolution
- unresolved
- no resolver link, observed 2026-08-06T17:24:48.957034Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 0dfde28b-beb9-405f-9eb7-9ad4c448a3df · outbound
This paper cites Scientific machine learning through physics–informed neural networks: Where we are and what’s next.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Scientific machine learning through physics–informed neural networks: Where we are and what’s next
Reference 44
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.384718Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 419d546f-6c67-4856-bde8-4ecfcaa05b44 · outbound
This paper cites Hidden fluid mechanics: Learning velocity and pressure fields from flow visualizations.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Hidden fluid mechanics: Learning velocity and pressure fields from flow visualizations
Reference 45
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.374515Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation ec88485a-663c-44af-b7fc-3b9b36fd241c · outbound
This paper cites Physics-informed deep neural networks for learning parameters and consti- tutive relationships in subsurface flow problems.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-informed deep neural networks for learning parameters and consti- tutive relationships in subsurface flow problems
Reference 46
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.365203Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 9b65ab4d-b1f7-4a01-966e-4eabca5273bd · outbound
This paper cites an unresolved cited work.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work
Reference 47
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T17:24:49.355281Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 62c5cef7-d566-4d73-bc58-95782f5fa91f · outbound
This paper cites Understand- ing and mitigating gradient flow pathologies in physics- informed neural networks.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Understand- ing and mitigating gradient flow pathologies in physics- informed neural networks
Reference 48
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.334861Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation b9067ee8-78db-4e49-a785-9e3d13508c17 · outbound
This paper cites L., and Sbalzarini, I.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review L., and Sbalzarini, I
Reference 49
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.322746Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 82c0c2ca-54ef-42ee-90e0-5838a5cdad8c · outbound
This paper cites Self- adaptive physics-informed neural networks.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Self- adaptive physics-informed neural networks
Reference 50
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.308751Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 506e3bd2-ee9d-47b0-b1d7-a21c0c0df6c3 · outbound
This paper cites A dual-dimer method for training physics-constrained neural networks with minimax architecture.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A dual-dimer method for training physics-constrained neural networks with minimax architecture
Reference 51
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.298104Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 9b79f49d-66f9-4dc9-9789-9d914d203f28 · outbound
This paper cites The distribution of points in a cube and the approximate evaluation of integrals.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review The distribution of points in a cube and the approximate evaluation of integrals
Reference 52
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.288344Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation af08178e-aa5c-4bf5-b667-ae84d72f421b · outbound
This paper cites On the efficiency of certain quasi-random sequences of points in evaluating multi- dimensional integrals.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review On the efficiency of certain quasi-random sequences of points in evaluating multi- dimensional integrals
Reference 53
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.277158Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 9b8b0e72-2ae7-4ceb-9b1d-ff19bd6a32af · outbound
This paper cites Monte carlo methods for solv- ing multivariable problems.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Monte carlo methods for solv- ing multivariable problems
Reference 54
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.266275Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 9bdcaa2e-4777-4c3e-8b95-e456c0bdcf58 · outbound
This paper cites A comparison of three methods for selecting values of input variables in the analysis of output from a computer code.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A comparison of three methods for selecting values of input variables in the analysis of output from a computer code
Reference 55
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.254397Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 4e3758eb-e8df-410f-8818-74a984c8712f · outbound
This paper cites Not all sam- ples are created equal: Deep learning with importance sam- pling.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Not all sam- ples are created equal: Deep learning with importance sam- pling
Reference 56
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.239951Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation fcaf447d-cab9-4937-8243-2c61a9cb2b51 · outbound
This paper cites Variance Reduction in SGD by Distributed Importance Sampling.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Variance Reduction in SGD by Distributed Importance Sampling
Reference 57
- Resolution
- unresolved
- no resolver link, observed 2026-08-06T17:24:49.009550Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 7864032a-e17c-4945-be59-fc77e74e6bdf · outbound
This paper cites Efficient training of physics-informed neural networks via importance sampling.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Efficient training of physics-informed neural networks via importance sampling
Reference 58
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.222750Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation eed1af24-47b0-49a5-9f62-acc5d94e844f · outbound
This paper cites Biased Importance Sampling for Deep Neural Network Training.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Biased Importance Sampling for Deep Neural Network Training
Reference 59
- Resolution
- unresolved
- no resolver link, observed 2026-08-06T17:24:49.016554Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation a1a5b040-59ea-40ae-aacc-fc814100421a · outbound
This paper cites Das-pinns: A deep adaptive sampling method for solving high-dimensional partial differential equations.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Das-pinns: A deep adaptive sampling method for solving high-dimensional partial differential equations
Reference 60
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.212731Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation c728ec5b-6a21-46de-b0bf-87fa8e391197 · outbound
This paper cites Generative ad- versarial networks: An overview.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Generative ad- versarial networks: An overview
Reference 61
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.202619Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 7573598d-070f-4ea3-abe6-a8e224e055e0 · outbound
This paper cites When Graph Neural Network Meets Causality: Opportunities, Methodologies and An Outlook.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review When Graph Neural Network Meets Causality: Opportunities, Methodologies and An Outlook
Reference 62
- Resolution
- verified exact
- local_arxiv, observed 2026-08-06T17:24:49.063277Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 7c120bcb-88e3-47b2-ba34-57f16cf1df45 · outbound
This paper cites Automatic control in microelectronics manufactur- ing: Practices, challenges, and possibilities.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Automatic control in microelectronics manufactur- ing: Practices, challenges, and possibilities
Reference 2000
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.817637Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 49385967-42e8-40ba-b0a2-eb50048cf58e · outbound
This paper cites Microscopic modeling and optimal operation of plasma enhanced atomic layer deposition.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Microscopic modeling and optimal operation of plasma enhanced atomic layer deposition
Reference 2020
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.500589Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation f8c56610-0115-45c3-8b91-46ba7e2cdc64 · outbound
This paper cites Physics-informed neural networks with hard con- straints for inverse design.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-informed neural networks with hard con- straints for inverse design
Reference 2021
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.345570Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 2a691b75-85d2-4da8-9d27-2869cfb5263b · outbound
This paper cites Inverse dirichlet weighting enables reliable train- ing of physics-informed neural networks.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Inverse dirichlet weighting enables reliable train- ing of physics-informed neural networks
Reference 2023
- Resolution
- verified exact
- raw_fallback, observed 2026-08-06T17:24:49.179692Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Observation 648a4136-a8c4-4073-8bd0-ee81614680fb · outbound
This paper cites Opinion mining by convolutional neural networks for maximizing discoverability of nanomaterials.
Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Opinion mining by convolutional neural networks for maximizing discoverability of nanomaterials
Reference 2024
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T17:24:49.539602Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.
Pith citing papers
No inbound Pith citation observations are available.