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arxiv: 2512.03853 · 2 revisions

Modelling the Impact of Device Imperfections on Electron Shuttling in SiMOS devices

1. 2026-08-03 CONDITIONAL MODERATE v1.3.0-alltime-deepseek novelty 6.0
   162859 ms 21507 in 19363 out 2026-08-03T18:41:36.438926+00:00
2. 2026-05-17 UNVERDICTED LOW v0.9.0 novelty 6.0
   38720 ms 5534 in 1352 out 2026-05-17T02:16:25.385970+00:00