Paper Citation Record · LEDGER

Radio-frequency reflectometry in silicon carbide large-area transistors

As of 23 August 2026, this Paper Citation Record lists 39 of 39 outbound references and 0 inbound Pith citation observations for arXiv:2605.15389.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2605.15389 v1

Coverage vector

measured 39 of 39 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-05-19T15:21:06.137779Z

measured 39 of 39 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-23T06:30:58.430688+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

39 of 39 outbound references displayed

verified exact1
verified fuzzy17
unresolved20
parse uncertain0
malformed identifier1
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation e17f2efa-a7e0-46d3-a1e8-0c5a57d7a611 · outbound

This paper cites Our aluminium bond wires have a length ofl≈5 mm and diameter 50µm (r= 25µm), henceL bw ≈5 nH.

Radio-frequency reflectometry in silicon carbide large-area transistors Our aluminium bond wires have a length ofl≈5 mm and diameter 50µm (r= 25µm), henceL bw ≈5 nH

Reference 1

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.675564Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 79f20fce-eb58-4ba3-9273-6a36457d1b01 · outbound

This paper cites Substitutingl= 5 mm andr= 25µm givesR bw,dc ≈0.07 Ω.

Radio-frequency reflectometry in silicon carbide large-area transistors Substitutingl= 5 mm andr= 25µm givesR bw,dc ≈0.07 Ω

Reference 2

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.670289Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 5ae90a80-c8ce-4d5e-a33f-0f94ed118cdb · outbound

This paper cites Using a typical PCB trace in- ductance of order 1 nH/mm and measured trace lengths of approximately 10–15 mm yields inductance values re- ported in Table I.

Radio-frequency reflectometry in silicon carbide large-area transistors Using a typical PCB trace in- ductance of order 1 nH/mm and measured trace lengths of approximately 10–15 mm yields inductance values re- ported in Table I

Reference 3

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.728245Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 5c8c4624-6629-42e1-a692-6555354b9963 · outbound

This paper cites Substitution givesC p ≈4 pF.

Radio-frequency reflectometry in silicon carbide large-area transistors Substitution givesC p ≈4 pF

Reference 4

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.734619Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 0591bc35-2e80-4214-9606-730671bb1131 · outbound

This paper cites The values are taken atV DS = 0.

Radio-frequency reflectometry in silicon carbide large-area transistors The values are taken atV DS = 0

Reference 5

Resolution: malformed identifier; raw_fallback, observed 2026-05-19T15:22:37.701609Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 89298466-f101-481c-910c-f029da4a1f89 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 6

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.694543Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 65636aa2-b0ca-44aa-af94-3d35467c26ff · outbound

This paper cites Hence, we argue that also contact resistances must increase dramatically.

Radio-frequency reflectometry in silicon carbide large-area transistors Hence, we argue that also contact resistances must increase dramatically

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.697425Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation b421bd2f-9030-4062-b342-fc8a845b62c0 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 8

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.714221Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 503d4fb6-437b-4a3d-8890-ae874fc39607 · outbound

This paper cites Vigneau, F.

Radio-frequency reflectometry in silicon carbide large-area transistors Vigneau, F

Reference 9

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.730346Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 0f278484-4876-4823-9976-aabb0037ee8d · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 10

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.679638Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 6e960697-07e6-4307-bdae-c4e0b26f4ba0 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 11

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.683923Z

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No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation bbcca452-5b3f-4127-b2f4-aa671db758e2 · outbound

This paper cites Schaal, A.

Radio-frequency reflectometry in silicon carbide large-area transistors Schaal, A

Reference 12

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.732488Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation aab2dc11-d546-478e-9acd-2513b3c082e8 · outbound

This paper cites Ruffino, T.-Y.

Radio-frequency reflectometry in silicon carbide large-area transistors Ruffino, T.-Y

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.648821Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 9a03ba89-af94-4214-afaa-a737b6437cd2 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 14

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.672829Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 926c9acb-ade5-45b4-8ac9-3db4bf3cc3d4 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 15

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.718749Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation db9d4670-10b5-4d72-87e2-40b45ad873eb · outbound

This paper cites Scappucci, C.

Radio-frequency reflectometry in silicon carbide large-area transistors Scappucci, C

Reference 16

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.651729Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation c69e7421-2a7b-4910-95ac-dd6a4ec06dcc · outbound

This paper cites Banerjee, C.

Radio-frequency reflectometry in silicon carbide large-area transistors Banerjee, C

Reference 17

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.736629Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 4929b2f5-8568-435b-a0d2-bfe6926d49f9 · outbound

This paper cites Kimoto, Material science and device physics in SiC technology for high-voltage power devices, Japanese Journal of Applied Physics54, 040103 (2015).

Radio-frequency reflectometry in silicon carbide large-area transistors Kimoto, Material science and device physics in SiC technology for high-voltage power devices, Japanese Journal of Applied Physics54, 040103 (2015)

Reference 18

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.721192Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation b7191aaf-5374-43e1-9e18-4d712ed14f97 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 19

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.707960Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 9f70d560-0a40-44fe-a144-2ad98f286af6 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 20

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.710069Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation f1f2327b-7bd7-4ac2-809c-91179513b1b0 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 21

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.705729Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 8e403afb-3119-4924-a851-436ac67dddfa · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 22

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.712074Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation fbde705f-83e0-480b-97be-43a9914b84d1 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 23

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.716529Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation b154c625-ad49-4f7f-98d4-0147eaf6c8ae · outbound

This paper cites Baliga,Fundamentals of Power Semiconductor De- vices(Springer New York, NY, 2008).

Radio-frequency reflectometry in silicon carbide large-area transistors Baliga,Fundamentals of Power Semiconductor De- vices(Springer New York, NY, 2008)

Reference 24

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.654842Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 0a87b1a7-634b-407a-8569-065aa128cf67 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 25

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.699505Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 387bbcb7-78db-419a-be4e-c49361119ca4 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 26

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.692376Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation cb3d4401-9e2b-418c-97b0-ee82b96a04f0 · outbound

This paper cites Powell, E.

Radio-frequency reflectometry in silicon carbide large-area transistors Powell, E

Reference 27

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.688295Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 74d54c57-7f99-49a6-8443-9666b65ff8f8 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 28

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.690384Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 615d2714-ec9b-4f59-8ec3-a87f777ed9cb · outbound

This paper cites Nikolova, J.

Radio-frequency reflectometry in silicon carbide large-area transistors Nikolova, J

Reference 29

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.723411Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation c569a069-76ca-4038-9475-235b8a69fa8a · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 30

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.681763Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 14429552-4808-495e-aa48-a06ee0527362 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 31

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.686186Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 4e9d90bd-c503-4937-80bc-65cdb905721c · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 32

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.677713Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 8992ce0b-416a-440f-8df4-db90f64400ce · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 33

Resolution: verified exact; doi, observed 2026-05-19T15:22:37.202569Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation bbf26d7c-5eee-4f19-a3aa-178a0ebd799d · outbound

This paper cites Kimoto and J.

Radio-frequency reflectometry in silicon carbide large-area transistors Kimoto and J

Reference 34

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.725691Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 278e26b1-5697-4587-ace4-b240e62460a5 · outbound

This paper cites Robert, S.

Radio-frequency reflectometry in silicon carbide large-area transistors Robert, S

Reference 35

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.664230Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 63c2df1b-2c42-40e2-85a0-43d8e36fbbf2 · outbound

This paper cites Pernot, S.

Radio-frequency reflectometry in silicon carbide large-area transistors Pernot, S

Reference 36

Resolution: verified fuzzy; raw_fallback, observed 2026-05-19T15:22:37.703693Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 77a2aee8-84a4-4368-91ba-5b5cb8a18f13 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 37

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.661648Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 884629b8-1abf-4065-bfb9-43d477d7d671 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 38

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.667070Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 61abeff1-dbd2-4597-8ad5-57f7e8be80b9 · outbound

This paper cites an unresolved cited work.

Radio-frequency reflectometry in silicon carbide large-area transistors Unresolved cited work

Reference 39

Resolution: unresolved; raw_fallback, observed 2026-05-19T15:22:37.658447Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Pith citing papers

No inbound Pith citation observations are available.