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Integrity report for Contactless method to measure 2DEG charge density and band structure in high electron mobility transistor structures

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1801.04974 · pith:2018:4NT36NLGQRKUSFX7MYZWRMYMVV

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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