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Integrity report for Thickness-Dependent Spintronic Terahertz Emission in MBE-Grown PtTe₂: From Semiconductor to Type-II Dirac Semimetal

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.22932 · pith:2026:5HZ253MEPJYRCMIZZNFLJP4HQI

0Critical
0Advisory
5Detectors run
2026-06-03Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

doi_compliance completed v1.0.0 · findings 0 · 2026-06-03 06:54:24.540051+00:00
doi_title_agreement completed v1.0.0 · findings 0 · 2026-06-03 06:05:38.951609+00:00
ai_meta_artifact completed v1.0.0 · findings 0 · 2026-06-01 05:39:16.224071+00:00
claim_evidence completed v1.0.0 · findings 0 · 2026-05-28 18:04:55.826773+00:00
cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-25 18:23:49.904085+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/5HZ253ME/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.