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Integrity report for Truly concomitant and independently expressed short- and long-term plasticity in Bi2O2Se-based three-terminal memristor

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1810.00898 · pith:2018:A4MLZHDOFI2GFSKNCCDXH372P4

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Paper page arXiv integrity.json bundle.json

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Signed record

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