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PaDiM: a Patch Distribution Modeling Framework for Anomaly Detection and Localization
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We present a new framework for Patch Distribution Modeling, PaDiM, to concurrently detect and localize anomalies in images in a one-class learning setting. PaDiM makes use of a pretrained convolutional neural network (CNN) for patch embedding, and of multivariate Gaussian distributions to get a probabilistic representation of the normal class. It also exploits correlations between the different semantic levels of CNN to better localize anomalies. PaDiM outperforms current state-of-the-art approaches for both anomaly detection and localization on the MVTec AD and STC datasets. To match real-world visual industrial inspection, we extend the evaluation protocol to assess performance of anomaly localization algorithms on non-aligned dataset. The state-of-the-art performance and low complexity of PaDiM make it a good candidate for many industrial applications.
Forward citations
Cited by 3 Pith papers
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Wavelet-Enhanced PaDiM for Industrial Anomaly Detection
Replacing PaDiM's random channel sampling with per-layer wavelet subband selection yields test-set-optimized MVTec AD averages of 99.32% Image-AUC and 92.10% Pixel-AUC, and shows LL bands help detection while detail b...
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SP-Mamba: Spatial-Perception State Space Model for Unsupervised Medical Anomaly Detection
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