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Paper Citation Record · LEDGER

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review

As of 8 August 2026, this Paper Citation Record lists 66 of 66 outbound references and 0 inbound Pith citation observations for arXiv:2507.10983.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2507.10983 v1

Coverage vector

measured 66 of 66 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-06T17:24:49.026338Z

measured 66 of 66 standing notices

One-hop event checks from named stored sources.

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measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

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measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

66 of 66 outbound references displayed

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External citation measurements

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Outbound references

Observation 326d39fb-7726-4fc1-90d4-12e4e6b1e12a · outbound

This paper cites N., 2012.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review N., 2012

Reference 1

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Observation df8d66cc-d8f4-4275-a6dc-3b0e743779fc · outbound

This paper cites N., 2012, page 88, Chapter 3.1.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review N., 2012, page 88, Chapter 3.1

Reference 2

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Observation 84e2701a-e9bc-4d91-be34-9b18457c287c · outbound

This paper cites N., 2012, page 135, Chapter 3.3.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review N., 2012, page 135, Chapter 3.3

Reference 3

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Observation 7ba33ccd-1c44-4108-99f5-7f8b81687eac · outbound

This paper cites Handbook of thin film deposition.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Handbook of thin film deposition

Reference 4

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Observation 080aa49e-9f05-4b03-8574-342ddddeb378 · outbound

This paper cites F., Butler, S.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review F., Butler, S

Reference 5

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Observation 6cabeb66-3bc8-4bde-bb73-98dba779d362 · outbound

This paper cites What is machine learning?.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review What is machine learning?

Reference 6

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Observation 6acfda9b-b6b7-41a7-9b8f-be53fb544d19 · outbound

This paper cites D., 2019.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review D., 2019

Reference 7

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Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work

Reference 8

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Observation 59bf0381-29ea-4b42-ad90-807fbdca7c7b · outbound

This paper cites Physics- informed machine learning.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics- informed machine learning

Reference 9

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Observation 3bf8ee57-f969-4b7a-822d-58b32262e11b · outbound

This paper cites Physics-informed neural networks: A deep learning framework for solving forward and inverse problems in- volving nonlinear partial differential equations.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-informed neural networks: A deep learning framework for solving forward and inverse problems in- volving nonlinear partial differential equations

Reference 10

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Observation bd25bb3b-08ea-40f7-9803-f225697a1ffe · outbound

This paper cites Introduction to semiconductor manufactur- ing technology.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Introduction to semiconductor manufactur- ing technology

Reference 11

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Observation ea674ae3-4158-4ccb-aae8-7f55268c041b · outbound

This paper cites Moore’s law.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Moore’s law

Reference 12

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Observation d419c2ec-1bd2-4ea7-b990-03593878738b · outbound

This paper cites Euv lithography.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Euv lithography

Reference 13

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This paper cites Introduction to fin- fet: Formation process, strengths, and future exploration.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Introduction to fin- fet: Formation process, strengths, and future exploration

Reference 14

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Observation 1d538ad8-cd86-4a25-adb9-a1b2c7692141 · outbound

This paper cites Finfet ver- sus gate-all-around nanowire fet: Performance, scaling, and variability.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Finfet ver- sus gate-all-around nanowire fet: Performance, scaling, and variability

Reference 15

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Observation 3051e1e4-ee15-4a9a-a8e1-903d87263355 · outbound

This paper cites High-k/metal gate innovations en- abling continued cmos scaling.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review High-k/metal gate innovations en- abling continued cmos scaling

Reference 16

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Observation 45bbbeaa-4d12-47d6-94fd-a1d797316adc · outbound

This paper cites Recent advances and trends in advanced packaging.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Recent advances and trends in advanced packaging

Reference 17

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Observation a385feb9-0e8d-4b9b-9385-d807c14065a8 · outbound

This paper cites Chapter 12 - structure and prop- erties of films.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Chapter 12 - structure and prop- erties of films

Reference 18

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Observation e7b77a75-eb4b-403a-8ef3-19a464a19c41 · outbound

This paper cites E., 2000.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review E., 2000

Reference 19

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Observation 5068aa08-2ace-4133-b427-344981100d76 · outbound

This paper cites Chemical methods of thin film de- position: Chemical vapor deposition, atomic layer depo- sition, and related technologies.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Chemical methods of thin film de- position: Chemical vapor deposition, atomic layer depo- sition, and related technologies

Reference 20

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Observation 54ccd40e-8782-4b28-82f9-c9c3c9c1665f · outbound

This paper cites Atomic layer deposi- tion and other thin film deposition techniques: from princi- ples to film properties.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Atomic layer deposi- tion and other thin film deposition techniques: from princi- ples to film properties

Reference 21

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Observation 9a9f80de-9ea0-4ed1-acba-d4f64c4fe5cc · outbound

This paper cites Chapter 3 - an overview of deep learning in big data, image, and signal processing in the modern digital age.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Chapter 3 - an overview of deep learning in big data, image, and signal processing in the modern digital age

Reference 22

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This paper cites A comprehensive literature review of the applications of ai techniques through the lifecycle of indus- trial equipment.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A comprehensive literature review of the applications of ai techniques through the lifecycle of indus- trial equipment

Reference 23

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This paper cites Artificial intelligence and machine learning approaches to energy demand-side response: A systematic review.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Artificial intelligence and machine learning approaches to energy demand-side response: A systematic review

Reference 24

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Observation 56823f20-447f-444d-a173-ecb5d9a759c5 · outbound

This paper cites Deepsem- net: Enhancing sem defect analysis in semiconductor manufacturing with a dual-branch cnn-transformer archi- tecture.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Deepsem- net: Enhancing sem defect analysis in semiconductor manufacturing with a dual-branch cnn-transformer archi- tecture

Reference 25

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This paper cites Image-driven machine learning for automatic characterization of grain size and distribution in smart vanadium dioxide thin films.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Image-driven machine learning for automatic characterization of grain size and distribution in smart vanadium dioxide thin films

Reference 26

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This paper cites Deep transfer wasserstein adversarial network for wafer map defect recognition.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Deep transfer wasserstein adversarial network for wafer map defect recognition

Reference 27

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Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work

Reference 28

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This paper cites Humana Press, Totowa, NJ, pp.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Humana Press, Totowa, NJ, pp

Reference 29

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Observation 4390176b-b4db-48bf-9f84-a916e101d4ad · outbound

This paper cites Machine learning-based model- ing and operation for ald of sio2 thin-films using data from a multiscale cfd simulation.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Machine learning-based model- ing and operation for ald of sio2 thin-films using data from a multiscale cfd simulation

Reference 30

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Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work

Reference 31

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Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work

Reference 33

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Observation 4683a322-a880-48b2-a2c2-5ab832761bf4 · outbound

This paper cites Deep reinforcement learning: A brief survey.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Deep reinforcement learning: A brief survey

Reference 34

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Observation 3c991e2f-74be-459d-b5ea-88788994119c · outbound

This paper cites Exploring machine learning for semiconductor process optimization: A sys- tematic review.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Exploring machine learning for semiconductor process optimization: A sys- tematic review

Reference 35

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Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.930142Z digest=sha256:056cd0cbdc58d1f54bfc7f0bdcadf3e956a45f78fefb2274bb7c88797006ad8b

Observation f1589db9-0bb3-4078-9852-1dd935212ce5 · outbound

This paper cites Artifi- cial neural network discrimination for parameter estimation and optimal product design of thin films manufactured by chemical vapor deposition.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Artifi- cial neural network discrimination for parameter estimation and optimal product design of thin films manufactured by chemical vapor deposition

Reference 36

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verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.448624Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.933155Z digest=sha256:2eecda18e3e648bd8b8b5ba7a269aace0086b4ab6288523b6304b619f6a362cd

Observation 82a144d2-5b2e-4c92-8bd6-e00bb61ad8da · outbound

This paper cites an unresolved cited work.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work

Reference 37

Resolution
unresolved
raw_fallback, observed 2026-08-06T17:24:49.489021Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.936676Z digest=sha256:1ff6b1e6d5b280a5c7d9bbf17b8b7a8e95ac7e891c6bc3a6c6ed959a05e65f32

Observation e4d8ec54-60d0-4b09-adf0-f90da41016e8 · outbound

This paper cites Optimizing the chemical vapor deposition process of 4h–sic epitaxial layer growth with machine-learning-assisted multiphysics simulations.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Optimizing the chemical vapor deposition process of 4h–sic epitaxial layer growth with machine-learning-assisted multiphysics simulations

Reference 38

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.438613Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.940673Z digest=sha256:202481eaeb9ca3f220ea8213b412e1b9de12a8c669012b30ca6cfab73dd43c4b

Observation bf3b1368-56df-4948-a3aa-a5a1e66d9066 · outbound

This paper cites When magnetron sput- tering deposition meets machine learning: Application to process anomaly detection.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review When magnetron sput- tering deposition meets machine learning: Application to process anomaly detection

Reference 39

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.428434Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.943849Z digest=sha256:3de90f82554461887f93158609f8070dff16a8fed226b843a4b126e96d646001

Observation 726ddccb-c6df-4c75-b2ef-91b5a080fdc5 · outbound

This paper cites A contextual sensor system for non-intrusive machine status and energy monitoring.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A contextual sensor system for non-intrusive machine status and energy monitoring

Reference 40

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.417775Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.947012Z digest=sha256:603766abbbaecc6da663857530cd28074e7a579206876f02f0a201a1aab31f18

Observation 4e2f9df8-4547-4903-9f05-6d105a36e591 · outbound

This paper cites Accelerating power flow calcu- lations in lv networks using physics-informed graph neural networks.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Accelerating power flow calcu- lations in lv networks using physics-informed graph neural networks

Reference 41

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.405663Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.950085Z digest=sha256:7b94b75200ea5003519d1038472971559285969ee7a7ad70884fd7f5084dd9bc

Observation 0d1a3d2d-7ab7-45cc-b966-b8470321693c · outbound

This paper cites Physical activation functions (pafs): An approach for more efficient induction of physics into physics-informed neural networks (pinns).

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physical activation functions (pafs): An approach for more efficient induction of physics into physics-informed neural networks (pinns)

Reference 42

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.395948Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.953576Z digest=sha256:9426413bd08f8a5009a3821f32768636da836eafeec1e098480677f7dae42ba4

Observation a798f3ac-c260-4cc7-9386-96ec12f64369 · outbound

This paper cites Physics-Informed Machine Learning: A Survey on Problems, Methods and Applications.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-Informed Machine Learning: A Survey on Problems, Methods and Applications

Reference 43

Resolution
unresolved
no resolver link, observed 2026-08-06T17:24:48.957034Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-06T17:24:48.957034Z digest=sha256:3b9e03c6cc99da13d8b248cee1448eed8e41680721aad129cead0f857453a897

Observation 0dfde28b-beb9-405f-9eb7-9ad4c448a3df · outbound

This paper cites Scientific machine learning through physics–informed neural networks: Where we are and what’s next.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Scientific machine learning through physics–informed neural networks: Where we are and what’s next

Reference 44

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.384718Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.960714Z digest=sha256:49b2f6c26ad0cdff38ac8a6601cb55f70084346949ce356a8467852f79e16419

Observation 419d546f-6c67-4856-bde8-4ecfcaa05b44 · outbound

This paper cites Hidden fluid mechanics: Learning velocity and pressure fields from flow visualizations.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Hidden fluid mechanics: Learning velocity and pressure fields from flow visualizations

Reference 45

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.374515Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.963500Z digest=sha256:19936ba43a2d9654930f298448906a1049ec7f2df06d860a63bb5ccefeccc8aa

Observation ec88485a-663c-44af-b7fc-3b9b36fd241c · outbound

This paper cites Physics-informed deep neural networks for learning parameters and consti- tutive relationships in subsurface flow problems.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-informed deep neural networks for learning parameters and consti- tutive relationships in subsurface flow problems

Reference 46

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.365203Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.966653Z digest=sha256:76fa6a265a4464c21c7756a9f58ee816b666f0970d0cbbd2c3ef123a5c7991ae

Observation 9b65ab4d-b1f7-4a01-966e-4eabca5273bd · outbound

This paper cites an unresolved cited work.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Unresolved cited work

Reference 47

Resolution
unresolved
raw_fallback, observed 2026-08-06T17:24:49.355281Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.969585Z digest=sha256:bdd549fc5c3b77fc2ecf1eb0458b8936b71dabec6ed32438cce0b70724790e37

Observation 62c5cef7-d566-4d73-bc58-95782f5fa91f · outbound

This paper cites Understand- ing and mitigating gradient flow pathologies in physics- informed neural networks.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Understand- ing and mitigating gradient flow pathologies in physics- informed neural networks

Reference 48

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.334861Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.975300Z digest=sha256:77d2c5f4109c6b67e18c5735cf03241b2fb44d791003e0fda34e56839716d986

Observation b9067ee8-78db-4e49-a785-9e3d13508c17 · outbound

This paper cites L., and Sbalzarini, I.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review L., and Sbalzarini, I

Reference 49

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.322746Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.978649Z digest=sha256:3934eae79ccf6f15948a303a43267feb89fab65f8926ff52faf181f770cff1ea

Observation 82c0c2ca-54ef-42ee-90e0-5838a5cdad8c · outbound

This paper cites Self- adaptive physics-informed neural networks.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Self- adaptive physics-informed neural networks

Reference 50

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.308751Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.984469Z digest=sha256:920f8800f2d160ee0d8ddcf4f5c57cc02332878eeac52dca07161feb61601c9f

Observation 506e3bd2-ee9d-47b0-b1d7-a21c0c0df6c3 · outbound

This paper cites A dual-dimer method for training physics-constrained neural networks with minimax architecture.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A dual-dimer method for training physics-constrained neural networks with minimax architecture

Reference 51

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.298104Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.987571Z digest=sha256:a7dce371a6b46ee1f0c36e5f2d870f03d1fa4bf563f014395be02e649712aca9

Observation 9b79f49d-66f9-4dc9-9789-9d914d203f28 · outbound

This paper cites The distribution of points in a cube and the approximate evaluation of integrals.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review The distribution of points in a cube and the approximate evaluation of integrals

Reference 52

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.288344Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.991250Z digest=sha256:8905d246a5ea149faa2dea40a896d0461922c542939a62d64365f5d2e55b53dd

Observation af08178e-aa5c-4bf5-b667-ae84d72f421b · outbound

This paper cites On the efficiency of certain quasi-random sequences of points in evaluating multi- dimensional integrals.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review On the efficiency of certain quasi-random sequences of points in evaluating multi- dimensional integrals

Reference 53

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.277158Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.994775Z digest=sha256:8416f4f147f1c2377fc2b7a2a588119a8f087e0f7d8a30cb4587cafdf9fcb369

Observation 9b8b0e72-2ae7-4ceb-9b1d-ff19bd6a32af · outbound

This paper cites Monte carlo methods for solv- ing multivariable problems.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Monte carlo methods for solv- ing multivariable problems

Reference 54

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.266275Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.998649Z digest=sha256:00a18ff5d64f3e0439e9d0077657c14e22e5c7f6cccff8524ceb4e0b3a037050

Observation 9bdcaa2e-4777-4c3e-8b95-e456c0bdcf58 · outbound

This paper cites A comparison of three methods for selecting values of input variables in the analysis of output from a computer code.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review A comparison of three methods for selecting values of input variables in the analysis of output from a computer code

Reference 55

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.254397Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:49.001766Z digest=sha256:67947d0209117453e3e15e64d9c846a23855710028b3efc37d5d6f642869eddb

Observation 4e3758eb-e8df-410f-8818-74a984c8712f · outbound

This paper cites Not all sam- ples are created equal: Deep learning with importance sam- pling.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Not all sam- ples are created equal: Deep learning with importance sam- pling

Reference 56

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.239951Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:49.005377Z digest=sha256:e2c0abdc752f84479155d4ad42857d26cf4f8aa80fed50fca98b01865a6bdf93

Observation fcaf447d-cab9-4937-8243-2c61a9cb2b51 · outbound

This paper cites Variance Reduction in SGD by Distributed Importance Sampling.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Variance Reduction in SGD by Distributed Importance Sampling

Reference 57

Resolution
unresolved
no resolver link, observed 2026-08-06T17:24:49.009550Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-06T17:24:49.009550Z digest=sha256:40e5eebf9b76bf2664bf5d415efbbf7878a509f02dfa5d120c1bf84e7ee50842

Observation 7864032a-e17c-4945-be59-fc77e74e6bdf · outbound

This paper cites Efficient training of physics-informed neural networks via importance sampling.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Efficient training of physics-informed neural networks via importance sampling

Reference 58

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.222750Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:49.013391Z digest=sha256:a83f501578066aaa89d81980ff5256af18ecaa0d1f87b9e5d7fbbdc2ed5223cd

Observation eed1af24-47b0-49a5-9f62-acc5d94e844f · outbound

This paper cites Biased Importance Sampling for Deep Neural Network Training.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Biased Importance Sampling for Deep Neural Network Training

Reference 59

Resolution
unresolved
no resolver link, observed 2026-08-06T17:24:49.016554Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-06T17:24:49.016554Z digest=sha256:d7e415cba8b1ae3aaed167693fc5e7b4246a911a38e5eb7383a771ec0e4e015b

Observation a1a5b040-59ea-40ae-aacc-fc814100421a · outbound

This paper cites Das-pinns: A deep adaptive sampling method for solving high-dimensional partial differential equations.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Das-pinns: A deep adaptive sampling method for solving high-dimensional partial differential equations

Reference 60

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.212731Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:49.019952Z digest=sha256:6e499af23d0dd3153be961e8efea0864534ef03a36af99db09d9d5a9e82c6ecf

Observation c728ec5b-6a21-46de-b0bf-87fa8e391197 · outbound

This paper cites Generative ad- versarial networks: An overview.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Generative ad- versarial networks: An overview

Reference 61

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.202619Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:49.022978Z digest=sha256:a6b4748b6f39fb7ecf6c0d4f6e2ca2725638d9fbd4013f0e17539445c9da0911

Observation 7573598d-070f-4ea3-abe6-a8e224e055e0 · outbound

This paper cites When Graph Neural Network Meets Causality: Opportunities, Methodologies and An Outlook.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review When Graph Neural Network Meets Causality: Opportunities, Methodologies and An Outlook

Reference 62

Resolution
verified exact
local_arxiv, observed 2026-08-06T17:24:49.063277Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:49.026338Z digest=sha256:7437af740243e5a3504b21fafbeb1b606d1864b1bec1ed54a13bb812d6f6bb04

Observation 7c120bcb-88e3-47b2-ba34-57f16cf1df45 · outbound

This paper cites Automatic control in microelectronics manufactur- ing: Practices, challenges, and possibilities.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Automatic control in microelectronics manufactur- ing: Practices, challenges, and possibilities

Reference 2000

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.817637Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.762982Z digest=sha256:67a04698e1ad42b4a80c5a913c438ed845599ceec6030c287a30eb18af2a0314

Observation 49385967-42e8-40ba-b0a2-eb50048cf58e · outbound

This paper cites Microscopic modeling and optimal operation of plasma enhanced atomic layer deposition.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Microscopic modeling and optimal operation of plasma enhanced atomic layer deposition

Reference 2020

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.500589Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.915325Z digest=sha256:04fdef3726f9e3114d45c2e66dd0bda2cf377ff4256317be43be08fc5a31a22d

Observation f8c56610-0115-45c3-8b91-46ba7e2cdc64 · outbound

This paper cites Physics-informed neural networks with hard con- straints for inverse design.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Physics-informed neural networks with hard con- straints for inverse design

Reference 2021

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.345570Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.972383Z digest=sha256:f3b3bc10f5e27acf9a831656d5758c0bbcf5c31c10eea63b3ad74277dff60c20

Observation 2a691b75-85d2-4da8-9d27-2869cfb5263b · outbound

This paper cites Inverse dirichlet weighting enables reliable train- ing of physics-informed neural networks.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Inverse dirichlet weighting enables reliable train- ing of physics-informed neural networks

Reference 2023

Resolution
verified exact
raw_fallback, observed 2026-08-06T17:24:49.179692Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.981436Z digest=sha256:f329c9af9610d8b35d64c09020b8de3531d43d4d18bcf69895551c8b05ee7952

Observation 648a4136-a8c4-4073-8bd0-ee81614680fb · outbound

This paper cites Opinion mining by convolutional neural networks for maximizing discoverability of nanomaterials.

Physics-Informed Neural Networks For Semiconductor Film Deposition: A Review Opinion mining by convolutional neural networks for maximizing discoverability of nanomaterials

Reference 2024

Resolution
verified fuzzy
raw_fallback, observed 2026-08-06T17:24:49.539602Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.

source=pdf_text observed=2026-08-06T17:24:48.900751Z digest=sha256:b8ad3255f417fd354b2b9847881f0f1375b7d95940ee6823f72e102f7a265ea4

Pith citing papers

No inbound Pith citation observations are available.