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Integrity report for Microscopic Origin of Charged Impurity Scattering and Flicker Noise in MoS2 field-effect Transistors

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1403.3333 · pith:2014:JHGIOXMWFECM6XAUITC33FOY4I

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Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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