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Short Shor-style syndrome sequences

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arxiv 2008.05051 v1 pith:KT6MPW6O submitted 2020-08-12 quant-ph cs.ITmath.IT

Short Shor-style syndrome sequences

classification quant-ph cs.ITmath.IT
keywords errorcorrectionmeasurementslogicalfault-tolerantquantumdesignmeasurement
verification ladder T0 review T1 audit T2 compute T3 formal T4 reserved
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We optimize fault-tolerant quantum error correction to reduce the number of syndrome bit measurements. Speeding up error correction will also speed up an encoded quantum computation, and should reduce its effective error rate. We give both code-specific and general methods, using a variety of techniques and in a variety of settings. We design new quantum error-correcting codes specifically for efficient error correction, e.g., allowing single-shot error correction. For codes with multiple logical qubits, we give methods for combining error correction with partial logical measurements. There are tradeoffs in choosing a code and error-correction technique. While to date most work has concentrated on optimizing the syndrome-extraction procedure, we show that there are also substantial benefits to optimizing how the measured syndromes are chosen and used. As an example, we design single-shot measurement sequences for fault-tolerant quantum error correction with the 16-qubit extended Hamming code. Our scheme uses 10 syndrome bit measurements, compared to 40 measurements with the Shor scheme. We design single-shot logical measurements as well: any logical Z measurement can be made together with fault-tolerant error correction using only 11 measurements. For comparison, using the Shor scheme a basic implementation of such a non-destructive logical measurement uses 63 measurements. We also offer ten open problems, the solutions of which could lead to substantial improvements of fault-tolerant error correction.

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Cited by 3 Pith papers

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