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Integrity report for Reduced thermal conductivity of epitaxial GaAs on Si due to symmetry-breaking biaxial strain

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1901.03455 · pith:2019:NX34YLSGTBQAN4X52RQJ7SSKLZ

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Paper page arXiv integrity.json bundle.json

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Signed record

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