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Integrity report for Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at T=4 K

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.17073 · pith:2026:QUCY4L5HMZUB2GTNY77AYQESY7

0Critical
0Advisory
5Detectors run
2026-05-26Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

ai_meta_artifact completed v1.0.0 · findings 0 · 2026-05-26 22:39:17.531800+00:00
doi_title_agreement completed v1.0.0 · findings 0 · 2026-05-25 17:32:47.564001+00:00
doi_compliance completed v1.0.0 · findings 0 · 2026-05-24 16:01:47.278431+00:00
cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-23 18:23:15.685737+00:00
claim_evidence completed v1.0.0 · findings 0 · 2026-05-21 23:02:37.436648+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/QUCY4L5H/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.