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Integrity report for Strain-mediated metal-insulator transition in epitaxial ultra-thin films of NdNiO3

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1003.3073 · pith:2010:T25O2S2V7K7AWDBG3LAINUOMQ4

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Paper page arXiv integrity.json bundle.json

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