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Integrity report for Precise calibration of Mg concentration in MgxZn1-xO thin films grown on ZnO substrates

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1208.2074 · pith:2012:WPVAEKHDSSVMFKFTB4IOK6SM4J

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Paper page arXiv integrity.json bundle.json

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Signed record

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