Integrity report for Experimental TDPAC and Theoretical DFT Study of Structural, Electronic, and Hyperfine Properties in (¹¹¹In-->) ¹¹¹Cd-Doped SnO₂ Semiconductor: Ab Initio Modeling of the Electron-Capture-Decay After-Effects Phenomenon
A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.
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Paper page arXiv integrity.json bundle.json
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Signed record
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