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Integrity report for Impact of Surface Roughness in Measuring Optoelectronic Characteristics of Thin-Film Solar Cells

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2302.00613 · pith:2023:ZR2MNJ4NCSS6MO3PRVOUXJHXEM

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Paper page arXiv integrity.json bundle.json

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Signed record

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