Integrity report for Beam test results of 25 μm and 35 μm thick FBK UFSD]{Beam test results of 25 μm and 35 μm thick FBK ultra fast silicon detectors
A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.
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Paper page arXiv integrity.json bundle.json
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Signed record
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