Pith Number

pith:3T26QRDC

pith:2026:3T26QRDCYG2L3OY7NYPTMXVT7F

not attested not anchored not stored refs resolved

Building Reliable Arithmetic Multipliers Under NBTI Aging and Process Variations

Biresh Kumar Joardar, Masoud Heidary

Selective 2s complement transformations on multiplier inputs redistribute NBTI stress to extend circuit lifetime.

arxiv:2605.18444 v1 · 2026-05-18 · cs.AR · cs.AI

Open paper page JSON Open Graph Bundle Merged state Verified badge What is a Pith Number?

Add to your LaTeX paper

\usepackage{pith}
\pithnumber{3T26QRDCYG2L3OY7NYPTMXVT7F}

Prints a linked badge after your title and injects PDF metadata. Compiles on arXiv. Learn more · Embed verified badge

Record completeness

1 Bitcoin timestamp

2 Internet Archive

3 Author claim open · sign in to claim

4 Citations open

5 Replications open

✓ Portable graph bundle live · download bundle · merged state

The bundle contains the canonical record plus signed events. A mirror can host it anywhere and recompute the same current state with the deterministic merge algorithm.

Claims

C1strongest claim

By selectively applying 2s complement transformations to inputs, the method redistributes stress across transistors, reducing the effects of NBTI aging, and when integrated into systolic arrays demonstrates better lifetime compared to natural aging baseline while introducing negligible area and delay overheads.

C2weakest assumption

The sign-invariance property of multiplication permits selective 2s complement transformations on inputs that redistribute NBTI stress without changing the multiplication result or introducing functional errors.

C3one line summary

A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.

References

39 extracted · 39 resolved · 0 Pith anchors

[1] Device aging: A reliability and security concern, 2018

[2] Modeling the Interdependences between Voltage Fluctuation and BTI Aging, 2019

[3] System -level modeling of microprocessor reliability degradation due to BTI and HCI, 2014

[4] Three -Dimensional Mechanistic Modeling of Time - Dependent Dielectric Breakdown in Polycrystalline Thin Films, 2023

[5] Understanding and Mitigating Hardware Failures in Deep Learning Training Accelerator Systems, 2023

Receipt and verification

First computed	2026-05-20T00:06:01.365877Z
Builder	pith-number-builder-2026-05-17-v1
Signature	Pith Ed25519 (`pith-v1-2026-05`) · public key
Schema	pith-number/v1.0

Canonical hash

dcf5e84462c1b4bdbb1f6e1f365eb3f9459e1e5213625cb78971577d7f6cd018

Aliases

arxiv: 2605.18444 · arxiv_version: 2605.18444v1 · doi: 10.48550/arxiv.2605.18444 · pith_short_12: 3T26QRDCYG2L · pith_short_16: 3T26QRDCYG2L3OY7 · pith_short_8: 3T26QRDC

Agent API

Resolver JSON Graph JSON Events JSON Schema Signing key

Verify this Pith Number yourself

curl -sH 'Accept: application/ld+json' https://pith.science/pith/3T26QRDCYG2L3OY7NYPTMXVT7F \
  | jq -c '.canonical_record' \
  | python3 -c "import sys,json,hashlib; b=json.dumps(json.loads(sys.stdin.read()), sort_keys=True, separators=(',',':'), ensure_ascii=False).encode(); print(hashlib.sha256(b).hexdigest())"
# expect: dcf5e84462c1b4bdbb1f6e1f365eb3f9459e1e5213625cb78971577d7f6cd018

Canonical record JSON

{
  "metadata": {
    "abstract_canon_sha256": "b838be125f96c60ef718c988cd93c0906eef0a150ee3e5155f5cc777668be84e",
    "cross_cats_sorted": [
      "cs.AI"
    ],
    "license": "http://creativecommons.org/licenses/by/4.0/",
    "primary_cat": "cs.AR",
    "submitted_at": "2026-05-18T14:12:01Z",
    "title_canon_sha256": "a23b37f95118f6035293a89c618bbc86b64159ccc69a171bae23b6c8558e1f9c"
  },
  "schema_version": "1.0",
  "source": {
    "id": "2605.18444",
    "kind": "arxiv",
    "version": 1
  }
}