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Single-Event Upset Analysis of a Systolic Array based Deep Neural Network Accelerator
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Single-Event Upset Analysis of a Systolic Array based Deep Neural Network Accelerator
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Deep Neural Network (DNN) accelerators are extensively used to improve the computational efficiency of DNNs, but are prone to faults through Single-Event Upsets (SEUs). In this work, we present an in-depth analysis of the impact of SEUs on a Systolic Array (SA) based DNN accelerator. A fault injection campaign is performed through a Register-Transfer Level (RTL) based simulation environment to improve the observability of each hardware block, including the SA itself as well as the post-processing pipeline. From this analysis, we present the sensitivity, independent of a DNN model architecture, for various flip-flop groups both in terms of fault propagation probability and fault magnitude. This allows us to draw detailed conclusions and determine optimal mitigation strategies.
Forward citations
Cited by 2 Pith papers
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RTL Fault Injection of a Deployed Graph Neural Network Trigger for Belle II
Inter-stage liveness monitoring of GNN-ETM reveals MTTF estimates up to 78.7% lower than output-only observation and ranks Preprocessing and GNN stages as top hardening targets.
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RTL Fault Injection of a Deployed Graph Neural Network Trigger for Belle II
Inter-stage liveness monitoring of a deployed L1 GNN trigger estimates MTTF up to 78.7% lower than output-only monitoring, revealing a detection-latency bias in current FPGA verification.
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