D.W.Bi

Identifiers

• name variant D.W.Bi 0.60 · backfill

Papers (1)

1. Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology cond-mat.mtrl-sci · 2013 · author #3

Mentions

• 1307.0327 #3 · backfill · confidence 0.70 D.W.Bi

Frequent Coauthors

• C.Peng 1 shared papers
• H.X.Huang 1 shared papers
• M.H.Tang 1 shared papers
• Y.W.Zhang 1 shared papers
• Z.X.Zhang 1 shared papers