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Y.W.Zhang

Identifiers

  • name variant Y.W.Zhang 0.60 · backfill

Papers (1)

  1. Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology cond-mat.mtrl-sci · 2013 · author #1

Mentions

  • 1307.0327 #1 · backfill · confidence 0.70 Y.W.Zhang

Frequent Coauthors