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Srinivasan Raghavan

Identifiers

  • name variant Srinivasan Raghavan 0.60 · backfill

Papers (15)

  1. H2S assisted contact engineering: a universal approach to enhance hole conduction in all TMD Field-Effect Transistors and achieve ambipolar CVD MoS2 Transistors physics.app-ph · 2019 · author #4
  2. Multi-layer MoS2/GaN UV-Visible photodetector with observation of MoS2 band edge in spectral responsivity physics.app-ph · 2018 · author #5
  3. Thickness Dependent Parasitic Channel Formation at AlN/Si Interfaces cond-mat.mtrl-sci · 2017 · author #4
  4. Microwave Irradiation Assisted Deposition of Ga2O3 on III-nitrides for deep-UV opto-electronics cond-mat.mtrl-sci · 2017 · author #5
  5. Dielectric Engineering of HfO2 Gate Stacks Towards Normally-ON and Normally-OFF GaN HEMTs on Silicon cond-mat.mtrl-sci · 2017 · author #7
  6. An Early In-Situ Stress Signature of the AlN-Si Pre-growth Interface for Successful Integration of Nitrides with (111) Si cond-mat.mtrl-sci · 2017 · author #7
  7. Making Consistent Contacts to Graphene: Effect of Architecture and Growth Induced Defects cond-mat.mtrl-sci · 2016 · author #3
  8. Bright-field Nanoscopy: Visualizing Nano-structures with Localized Optical Contrast Using a Conventional Microscope physics.optics · 2015 · author #3
  9. Estimation of background carrier concentration in fully depleted GaN films cond-mat.mtrl-sci · 2015 · author #3
  10. Growth Stress Induced Tunability of Dielectric Constant in Thin Films cond-mat.mtrl-sci · 2015 · author #7
  11. Spotting 2-D Atomic Layers on Aluminum Nitride Thin Films cond-mat.mtrl-sci · 2015 · author #7
  12. A nearly relaxation-free opto-electronic memory from ultra-thin graphene-MoS$_2$ binary hybrids cond-mat.mtrl-sci · 2013 · author #6
  13. High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy cond-mat.mes-hall · 2012 · author #7
  14. Electrochemical integration of graphene with light absorbing copper-based thin films cond-mat.mtrl-sci · 2012 · author #4
  15. 1/f noise as a probe for investigating band structure in graphene cond-mat.mes-hall · 2010 · author #6

Mentions

  • 1506.07320 #3 · backfill · confidence 0.70 Srinivasan Raghavan
  • 1503.08299 #7 · backfill · confidence 0.70 Srinivasan Raghavan
  • 1503.06573 #7 · backfill · confidence 0.70 Srinivasan Raghavan
  • 1309.1455 #6 · backfill · confidence 0.70 Srinivasan Raghavan
  • 1203.5983 #7 · backfill · confidence 0.70 Srinivasan Raghavan
  • 1203.5655 #4 · backfill · confidence 0.70 Srinivasan Raghavan
  • 1009.5832 #6 · backfill · confidence 0.70 Srinivasan Raghavan

Frequent Coauthors