A new extended sampling method derived from factorization analysis, using both sound-soft and sound-hard reference disks, recovers location, size, and possibly shape of unknown clamped obstacles from limited far-field biharmonic data.
Kirsch, Characterization of the shape of a scattering obstacle using the spectral data of the far field operator,Inverse Problems,14, 1489–1512 (1998)
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Novel implementation of the extended sampling method for inverse biharmonic scattering
A new extended sampling method derived from factorization analysis, using both sound-soft and sound-hard reference disks, recovers location, size, and possibly shape of unknown clamped obstacles from limited far-field biharmonic data.