Non-contact AFM dissipation measurements detect superconducting signatures localized to approximately 200 nm wide edge channels in patterned LAO/STO devices, consistent with the intermediate carrier-density regime.
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Local probing of superconductivity at oxide interfaces with atomic force microscopy
Non-contact AFM dissipation measurements detect superconducting signatures localized to approximately 200 nm wide edge channels in patterned LAO/STO devices, consistent with the intermediate carrier-density regime.