Imaging reveals that resonant photonic structures can produce transverse electron streaking at optical frequencies via perpendicular light polarization, with measured profiles matching simulations.
Jasmin and Wang, Rui Ning and M
2 Pith papers cite this work. Polarity classification is still indexing.
2
Pith papers citing it
years
2026 2verdicts
UNVERDICTED 2representative citing papers
Monolithic Si3N4 platform achieves EPR fidelity 0.9875(3), HOM visibility 0.990(6), and four-photon GHZ fidelity 0.943(8) at 27 Hz—more than 100x prior silicon-photonic rates—using CMOS-compatible 150 mm wafer fabrication.
citing papers explorer
-
Imaging the transverse component of optical near-fields in resonant photonic structures
Imaging reveals that resonant photonic structures can produce transverse electron streaking at optical frequencies via perpendicular light polarization, with measured profiles matching simulations.